Acta Optica Sinica, Volume. 29, Issue 11, 3078(2009)
Extract Original Grating Information from Deformed Grating Pattern
[1] [1] Zheng Ruihua,Wang Yuxiao,Zhang Xueru et al..Two-dimensional phase-measuring profilometry[J].Appl.Opt.,2005,44(6):954-958
[2] [2] Mitsuo Takeda,Kazuhiro Mutoh.Fourier transform profilometry for the automatic measurement of 3-D object shapes[J].Appl.Opt.,1983,22(24):3977-3982
[3] [3] Mao Xianfu,Chen Wenjing,Su Xianyu.Analysis on an improved fourier transform profilometry[J].Chinese J.Lasers,2007,34(1):97-102
[7] [7] Zhong Jingang,Weng Jiawen.Dilating Gabor transform for the fringe analysis of 3-D shape measurement[J].Opt.Eng.,2004,43(4):895-899
[9] [9] Zhong Jingang,Weng Jiawen.Phase retrieval of optical fringe patterns from the ridge of a wavelet transform[J].Opt.Lett.,2005,30(19):2560-2562
[11] [11] Liu Huiqiang,Chen Wenjing,Su Xianyu et al..Fast fourier transform profilometry based on two-frequency grating projection[J].Opto-Electronic Engineering,2004,31(4):39-42
Get Citation
Copy Citation Text
Yang Chuping, Weng Jiawen, Zhao Jing, Yang Yi. Extract Original Grating Information from Deformed Grating Pattern[J]. Acta Optica Sinica, 2009, 29(11): 3078
Category: Instrumentation, Measurement and Metrology
Received: Dec. 24, 2008
Accepted: --
Published Online: Nov. 16, 2009
The Author Email: Chuping Yang (yangchp@scau.edu.cn)