Optoelectronic Technology, Volume. 40, Issue 4, 284(2020)

A Measurement Method Based on SNCC for Centrosymmetric Markers

Bing XU1,2, Yuefei CHEN2, Chang ZHOU2, Jianhua ZHANG1, and Xifeng LI1
Author Affiliations
  • 1.School of Mechatronic Engineering and Automation, Shanghai University, Shanghai 200444, CHN
  • 2Shanghai Micro⁃electronics Equipment (Group) Co.,Ltd, Shanghai 0103, CHN
  • show less
    Figures & Tables(9)
    Principle of calculating center position of centrosymmetric marker
    Subgraph interception and rotation process from target image
    Template matching principle based on gray-scale NCC
    Principle of 8-domain correlation calculating
    Substrate fine alignment marking process pictures and standard marking picture
    Comparison curves of HALCON NCC, HALCON Shape and SNCC matching score
    Defocus marker image and template
    Comparison curves of HALCON NCC, HALCON Shape and SNCC matching score for defocus markers
    • Table 1. HALCON NCC、HALCON Shape及SNCC测量离焦标记图像重复性对比表

      View table
      View in Article

      Table 1. HALCON NCC、HALCON Shape及SNCC测量离焦标记图像重复性对比表

      x_3sigma/(pixel)y_3sigma/(pixel)
      HALCON NCC0.2720.274
      HALCON Shape0.3700.293
      SNCC0.2550.242
    Tools

    Get Citation

    Copy Citation Text

    Bing XU, Yuefei CHEN, Chang ZHOU, Jianhua ZHANG, Xifeng LI. A Measurement Method Based on SNCC for Centrosymmetric Markers[J]. Optoelectronic Technology, 2020, 40(4): 284

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Research and Trial-manufacture

    Received: Jun. 1, 2020

    Accepted: --

    Published Online: Jan. 12, 2021

    The Author Email:

    DOI:10.19453/j.cnki.1005-488x.2020.04.008

    Topics