Optoelectronic Technology, Volume. 40, Issue 4, 284(2020)
A Measurement Method Based on SNCC for Centrosymmetric Markers
Fig. 1. Principle of calculating center position of centrosymmetric marker
Fig. 2. Subgraph interception and rotation process from target image
Fig. 5. Substrate fine alignment marking process pictures and standard marking picture
Fig. 6. Comparison curves of HALCON NCC, HALCON Shape and SNCC matching score
Fig. 8. Comparison curves of HALCON NCC, HALCON Shape and SNCC matching score for defocus markers
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Bing XU, Yuefei CHEN, Chang ZHOU, Jianhua ZHANG, Xifeng LI. A Measurement Method Based on SNCC for Centrosymmetric Markers[J]. Optoelectronic Technology, 2020, 40(4): 284
Category: Research and Trial-manufacture
Received: Jun. 1, 2020
Accepted: --
Published Online: Jan. 12, 2021
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