Acta Optica Sinica, Volume. 42, Issue 1, 0131001(2022)

Analysis and Simulation on Damage Characteristics of Multilayer Optical Film by Pulsed Laser

Mengke Zheng1,2, Jie Li2, Rongzhu Zhang1、**, and Liqun Chai2、*
Author Affiliations
  • 1College of Electronics and Information Engineering, Sichuan University, Chengdu, Sichuan 610064, China
  • 2Research Center of Laser Fusion, China Academy of Engineering Physics, Mianyang, Sichuan 621900, China
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    Figures & Tables(16)
    Analysis model of multilayer film irradiated by laser
    Standing wave field distribution in multilayers
    Temperature distribution in film under incidence of pulse with pulse width of 10 ns. (a) Temperature at center of film; (b) curve of temperature peak with time
    Spatial distribution of stress field in film under incidence of pulse with pulse width of 10 ns. (a) Radial stress; (b) annular stress; (c) axial stress
    Maximum stress field distribution of film under incidence of pulse with pulse width of 10 ns. (a) HfO2 film layer; (b) SiO2 film layer
    Change of photon ionization rate in film under incidence of pulse with pulse width of 10 ns. (a) Avalanche ionization rate; (b) multiphoton ionization rate
    Free electron density distribution curve in film under incidence of pulse with pulse width of 10 ns
    Temperature distribution in film under incidence of pulse with laser energy density of 8 J/cm2. (a) Temperature at center of film; (b) curve of temperature peak with time
    Spatial distribution of stress field in film under incidence of pulse with laser energy density of 8 J/cm2. (a) Radial stress; (b) annular stress; (c) axial stress
    Maximum stress field distribution of film under incidence of pulse with laser energy density of 8 J/cm2. (a) HfO2 film layer; (b) SiO2 film layer
    Free electron density distribution curve in film under incidence of pulse with laser energy density of 8 J/cm2
    Change curves of membrane damage threshold with pulse width
    • Table 1. Thermodynamic parameters of thin film materials

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      Table 1. Thermodynamic parameters of thin film materials

      MaterialRefractiveindexAbsorptioncoefficient /cm-1ρc /(J·cm-3·℃ -1)K /(10-3 W·cm-1·℃-1)Meltingpoint /℃Young’smodulus /(1010 Pa)Thermalcoefficient ofexpansion /(10-6-1)Poisson’sratio
      HfO21.8123.544.6420.0285024.06.60.29
      SiO21.4311.412.101.717238.70.50.16
    • Table 2. Physical parameters of thin film materials

      View table

      Table 2. Physical parameters of thin film materials

      MaterialBandgap /eVEffectiveelectronmass /(10-31 kg)Initial freeelectrondensity /cm-3Electronsaturateddrift velocity /(105 m·s-1)Field intensityto overcomeionizationscattering /(MV·m-1)Field intensityto overcomephononscattering /(MV·m-1)Field intensityto overcomethermalscattering /(MV·m-1)
      HfO25.72.915210102.0303.20.01
      SiO27.84.555010101.7303.20.01
    • Table 3. Film damage characteristics under different pulse widths

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      Table 3. Film damage characteristics under different pulse widths

      ParameterPulse width /ns
      1020304050
      Maximum temperature /℃18601721161615401482
      Maximum hoop stress /(108 Pa)1.421.221.029.909.20
      Free electron density /(1016 cm-3)1.1051.0661.0581.0491.042
      Whether it is damagedYesYesNoNoNo
    • Table 4. Film damage characteristics under different energy density

      View table

      Table 4. Film damage characteristics under different energy density

      ParameterEnergy density /(J·cm-2)
      108642
      Maximum temperature /℃186014891117744372
      Maximum hoop stress /(107 Pa)14.1011.508.785.802.93
      Free electron density /(1016 cm-3)1.1051.0951.0821.0621.042
      Whether it is damagedYesYesNoNoNo
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    Mengke Zheng, Jie Li, Rongzhu Zhang, Liqun Chai. Analysis and Simulation on Damage Characteristics of Multilayer Optical Film by Pulsed Laser[J]. Acta Optica Sinica, 2022, 42(1): 0131001

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    Paper Information

    Category: Thin Films

    Received: May. 28, 2021

    Accepted: Aug. 3, 2021

    Published Online: Dec. 22, 2021

    The Author Email: Zhang Rongzhu (zhang_rz@scu.edu.cn), Chai Liqun (chailiqun@163.com)

    DOI:10.3788/AOS202242.0131001

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