Laser & Optoelectronics Progress, Volume. 51, Issue 1, 11102(2014)

Effects of Polarization State and Effective Numerical Aperture on the Resolution in Confocal Total Internal Reflection Microscopy

Wei Tongda1,2,3、*, Zhang Yunhai3, Xiao Yun1,2,3, and Tang Yuguo1,3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    [1] ZHANG Wen-jing, ZHANG Zhi-wei, SUN Yun-qiang, ZHU Xiang, DENG Nan, ZHANG Cai-feng, GUO Peng-cheng, LI Qing-sheng. Polarization Display and Measurement Experiment of Elliptically Polarized Beam[J]. Acta Photonica Sinica, 2017, 46(5): 526003

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    Wei Tongda, Zhang Yunhai, Xiao Yun, Tang Yuguo. Effects of Polarization State and Effective Numerical Aperture on the Resolution in Confocal Total Internal Reflection Microscopy[J]. Laser & Optoelectronics Progress, 2014, 51(1): 11102

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    Paper Information

    Category: Imaging Systems

    Received: Sep. 9, 2013

    Accepted: --

    Published Online: Dec. 20, 2013

    The Author Email: Wei Tongda (weitd@sibet.ac.cn)

    DOI:10.3788/lop51.011102

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