High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation

Rui Zhang; Yuanyuan Chen; Ning Jing; Zhibin Wang; Kewu Li; Kunyang Xie

doi:10.3788/AOS201939.0312002

Acta Optica Sinica, Volume. 39, Issue 3, 0312002(2019)

High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation

Rui Zhang^1,2,3、*, Yuanyuan Chen^1,2,3, Ning Jing^1,2,3, Zhibin Wang^1,2,3, Kewu Li^1,2,3, and Kunyang Xie^1,2,3

Author Affiliations

¹ Engineering and Technology Research Center of Shanxi Province for Optical-Electric Information and Instrument, North University of China, Taiyuan, Shanxi 0 30051, China

² Key Laboratory of Instrument Science & Dynamic Measurement, Ministry of Education, North University of China, Taiyuan, Shanxi 0 30051, China;

³ State Key Laboratory for Electronic Measurement Technology, North University of China, Taiyuan, Shanxi 0 30051, China

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Rui Zhang, Yuanyuan Chen, Ning Jing, Zhibin Wang, Kewu Li, Kunyang Xie. High-Precision Measurement of Mid-Infrared Waveplate Phase Retardation Based on Dual Photoelastic Difference Frequency Modulation[J]. Acta Optica Sinica, 2019, 39(3): 0312002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Aug. 31, 2018

Accepted: Oct. 18, 2018

Published Online: May. 10, 2019

The Author Email:

DOI:10.3788/AOS201939.0312002

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