Frontiers of Optoelectronics, Volume. 10, Issue 3, 308(2017)

Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions

Sergey SAVENKOV1、*, Alexander V. PRIEZZHEV2, Yevgen OBEREMOK1, Sergey SHOLOM3, and Ivan KOLOMIETS1
Author Affiliations
  • 1Taras Shevchenko National University of Kyiv, Faculty of Radio Physics, Electronics, and Computer Systems, Vladimirskaya str. 64, 01033 Kiev, Ukraine
  • 2Lomonosov Moscow State University, Department of Physics and International Laser Center, Vorobiovy Gory, 119992 Moscow, Russia
  • 3Oklahoma State University, Department of Physics, 145 Physical Sciences Building, Stillwater, Oklahoma 74078, USA
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    Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308

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    Paper Information

    Category: RESEARCH ARTICLE

    Received: Apr. 5, 2017

    Accepted: Jul. 4, 2017

    Published Online: Jan. 17, 2018

    The Author Email: Sergey SAVENKOV (sns@univ.kiev.ua)

    DOI:10.1007/s12200-017-0727-3

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