Frontiers of Optoelectronics, Volume. 10, Issue 3, 308(2017)
Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions
Mueller matrices were measured for natural (or reference) samples of human nails and samples irradiated by a 2 Gy ionizing radiation dose. The elements of the total Mueller matrix as a function of scattering angle were measured in backscattering mode at a wavelength of 632.8 nm. Several types of depolarizing Mueller matrix decompositions, namely, Ossikovsky, Williams, and Chipman, were calculated as a function of scattering angle for each nail sample. A comparative analysis of the sensitivity of the Mueller matrix decompositions in relation to the problem of emergency dose assessment in nails was performed.<作者简介Sergey Savenkov obtained his Ph.D. and Sc.D. degrees from Taras Shevchenko National University of Kyiv (Ukraine) in 1996 and 2013, respectively. Since 1986, Dr. Savenkov has been a researcher at the Faculty of Radio Physics, Electronics, and Computer Systems, Taras Shevchenko National University of Kyiv (Ukraine). His areas of scientific interest include laser polarimetry, polarimetry of anisotropic and depolarized media, and biomedical optics.
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Sergey SAVENKOV, Alexander V. PRIEZZHEV, Yevgen OBEREMOK, Sergey SHOLOM, Ivan KOLOMIETS. Characterization of irradiated nails in terms of depolarizing Mueller matrix decompositions[J]. Frontiers of Optoelectronics, 2017, 10(3): 308
Category: RESEARCH ARTICLE
Received: Apr. 5, 2017
Accepted: Jul. 4, 2017
Published Online: Jan. 17, 2018
The Author Email: Sergey SAVENKOV (sns@univ.kiev.ua)