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Journal of Optoelectronics · Laser, Volume. 35, Issue 6, 623(2024)

Comparison of the effects of Fe and Cu impurities on the response characteristics of silicon

LYU Tong and ZHANG Rongzhu*
Author Affiliations
  • College of Electronics Information, Sichuan University, Chengdu, Sichuan 610065, China
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    LYU Tong, ZHANG Rongzhu. Comparison of the effects of Fe and Cu impurities on the response characteristics of silicon[J]. Journal of Optoelectronics · Laser, 2024, 35(6): 623

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    Received: Nov. 16, 2022

    Accepted: Dec. 13, 2024

    Published Online: Dec. 13, 2024

    The Author Email: ZHANG Rongzhu (zhang_rz@scu.edu.cn)

    DOI:10.16136/j.joel.2024.06.0778

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology