Photonics Research, Volume. 6, Issue 8, 794(2018)

Temperature dependence of the ionization coefficients of InAlAs and AlGaAs digital alloys

Yuan Yuan1, Jiyuan Zheng1, Yaohua Tan1, Yiwei Peng1, Ann-Kathryn Rockwell2, Seth R. Bank2, Avik Ghosh1, and Joe C. Campbell1、*
Author Affiliations
  • 1Electrical and Computer Engineering Department, University of Virginia, 351 McCormick Rd., Charlottesville, Virginia 22904, USA
  • 2Electrical and Computer Engineering Department, University of Texas at Austin, 1616 Guadalupe St., Austin, Texas 78758, USA
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    Figures & Tables(10)
    Schematic cross sections of (a) InAlAs APDs and (b) AlGaAs APDs.
    Excess noise factor, F⟨M⟩, of InAlAs digital and random alloy APDs.
    Excess noise factor, F⟨M⟩, of AlGaAs digital and random alloy APDs.
    (a) InAlAs digital and random alloy supercells, (b) positions in reciprocal space, (c) band structures of InAlAs random alloy at different positions, and (d) band structures of InAlAs digital alloy at different positions. The mini-gap in the valence band is marked.
    Temperature dependence of (a) excess noise factor and (b) ionization coefficient ratio k for InAlAs random alloy APD.
    Temperature dependence of (a) excess noise factor and (b) ionization coefficient ratio k for InAlAs digital alloy APD.
    Band structures of (a) AlGaAs random alloy and (b) AlGaAs digital alloy.
    Temperature dependence of (a) excess noise factor and (b) ionization coefficient ratio k for AlGaAs digital alloy p-i-n APD.
    Ionization coefficients of (a) InAlAs random alloy, (b) InAlAs digital alloy, and (c) AlGaAs digital alloy at different temperatures.
    Plots of Eqs. (7) and (8), the temperature-dependent ionization coefficients of the InAlAs digital alloy.
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    Yuan Yuan, Jiyuan Zheng, Yaohua Tan, Yiwei Peng, Ann-Kathryn Rockwell, Seth R. Bank, Avik Ghosh, Joe C. Campbell, "Temperature dependence of the ionization coefficients of InAlAs and AlGaAs digital alloys," Photonics Res. 6, 794 (2018)

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    Paper Information

    Category: Optical Devices

    Received: Apr. 17, 2018

    Accepted: Jun. 8, 2018

    Published Online: Aug. 1, 2018

    The Author Email: Joe C. Campbell (jccuva@virginia.edu)

    DOI:10.1364/PRJ.6.000794

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