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Chinese Optics Letters, Volume. 14, Issue 12, 120901(2016)

Increased depth of focus in random-phase-free holographic projection

Michal Makowski1、*, Tomoyoshi Shimobaba2, and Tomoyoshi Ito2
Author Affiliations
  • 1Warsaw University of Technology, Faculty of Physics, Warsaw 00-662, Poland
  • 2Graduate School of Engineering, Chiba University, 1-33 Yayoi-cho, Inage-ku, Chiba 263-8522, Japan
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    [1] M. Makowski, I. Ducin, K. Kakarenko, J. Suszek, A. Kowalczyk. Photon. Lett. Poland, 8, 26(2016).

    [2] R. W. Gerchberg, W. O. Saxton. Optik, 35, 237(1972).

    [3] A. Czerwiński, K. Kakarenko, M. Sypek, M. Makowski, I. Ducin, J. Suszek, A. Kolodziejczyk, J. Bomba. Opt. Lett., 37, 4723(2012).

    [4] M. Makowski. Opt. Express, 21, 29205(2013).

    [5] T. Shimobaba, T. Ito. Opt. Express, 23, 9549(2015).

    [6] T. Shimobaba, T. Kakue, Y. Endo, R. Hirayama, D. Hiyama, S. Hasegawa, Y. Nagahama, M. Sano, M. Oikawa, T. Sugie, T. Ito. Opt. Express, 23, 17269(2015).

    [7] T. Shimobaba, T. Kakue, Y. Endo, R. Hirayama, D. Hiyama, S. Hasegawa, Y. Nagahama, M. Sano, M. Oikawa, T. Sugie, T. Ito. Opt. Commun., 355, 596(2015).

    [8] J. W. Goodman. Introduction to Fourier Optics(2005).

    CLP Journals

    [1] Chenliang Chang, Yijun Qi, Jun Wu, Jun Xia, Shouping Nie, "Image magnified lensless holographic projection by convergent spherical beam illumination," Chin. Opt. Lett. 16, 100901 (2018)

    Cited By

    [1] Micha? Makowski. Holographic Materials and Optical Systems [Working Title](2019).

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    Michal Makowski, Tomoyoshi Shimobaba, Tomoyoshi Ito, "Increased depth of focus in random-phase-free holographic projection," Chin. Opt. Lett. 14, 120901 (2016)

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    Paper Information

    Category: Holography

    Received: Sep. 13, 2016

    Accepted: Oct. 28, 2016

    Published Online: Aug. 2, 2018

    The Author Email: Michal Makowski (michal.makowski@if.pw.edu.pl)

    DOI:10.3788/COL201614.120901

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology