Acta Optica Sinica, Volume. 45, Issue 11, 1112002(2025)

Single-Shot Light Field Characterization Technology Based on Compressive Shearing Interferometry

Miaoyan Tong1,2, Youjian Yi1, Ping Zhu1、*, Xiuyu Yao1,2, Ailin Guo1, Dongjun Zhang1, Hailun Zeng1, Zezhao Gong1,2, Lijie Cui1, Meizhi Sun1, Xiao Liang1, Xinglong Xie1, and Jianqiang Zhu1、**
Author Affiliations
  • 1Key Laboratory of High Power Laser and Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2Center of Materials Science and Optoelectronic Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    References(29)

    [25] Dong Z Q, Huang X W, Xu R et al. Measurement method for surface topography based on quadriwave lateral shearing interferometry[J]. Laser Technology, 48, 906-912(2024).

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    Miaoyan Tong, Youjian Yi, Ping Zhu, Xiuyu Yao, Ailin Guo, Dongjun Zhang, Hailun Zeng, Zezhao Gong, Lijie Cui, Meizhi Sun, Xiao Liang, Xinglong Xie, Jianqiang Zhu. Single-Shot Light Field Characterization Technology Based on Compressive Shearing Interferometry[J]. Acta Optica Sinica, 2025, 45(11): 1112002

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Feb. 17, 2025

    Accepted: Apr. 11, 2025

    Published Online: Jun. 23, 2025

    The Author Email: Ping Zhu (zhp1990@siom.ac.cn), Jianqiang Zhu (jqzhu@siom.ac.cn)

    DOI:10.3788/AOS250607

    CSTR:32393.14.AOS250607

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