Acta Optica Sinica, Volume. 45, Issue 11, 1112002(2025)
Single-Shot Light Field Characterization Technology Based on Compressive Shearing Interferometry
[25] Dong Z Q, Huang X W, Xu R et al. Measurement method for surface topography based on quadriwave lateral shearing interferometry[J]. Laser Technology, 48, 906-912(2024).
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Miaoyan Tong, Youjian Yi, Ping Zhu, Xiuyu Yao, Ailin Guo, Dongjun Zhang, Hailun Zeng, Zezhao Gong, Lijie Cui, Meizhi Sun, Xiao Liang, Xinglong Xie, Jianqiang Zhu. Single-Shot Light Field Characterization Technology Based on Compressive Shearing Interferometry[J]. Acta Optica Sinica, 2025, 45(11): 1112002
Category: Instrumentation, Measurement and Metrology
Received: Feb. 17, 2025
Accepted: Apr. 11, 2025
Published Online: Jun. 23, 2025
The Author Email: Ping Zhu (zhp1990@siom.ac.cn), Jianqiang Zhu (jqzhu@siom.ac.cn)
CSTR:32393.14.AOS250607