Infrared and Laser Engineering, Volume. 47, Issue 1, 106002(2018)
Analysis of laser-induced damage mechanism in Si photodiode based on parameter extraction of equivalent circuit
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Shi Yubin, Zhang Jianmin, Zhang Zhen, Lin Xinwei, Cheng Deyan, Dou Pengcheng. Analysis of laser-induced damage mechanism in Si photodiode based on parameter extraction of equivalent circuit[J]. Infrared and Laser Engineering, 2018, 47(1): 106002
Paper Information
Category: 激光技术及应用
Received: Jun. 15, 2017
Accepted: Aug. 20, 2017
Published Online: Jan. 30, 2018
The Author Email: Yubin Shi (shiyubin@nint.ac.cn)
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