Optimizing power oscillations in an ellipsometric system

Manoel P. Araújo; Stefano De Leo; Gabriel G. Maia

doi:10.3788/COL201816.031406

Chinese Optics Letters, Volume. 16, Issue 3, 031406(2018)

Optimizing power oscillations in an ellipsometric system

Manoel P. Araújo¹, Stefano De Leo^2、*, and Gabriel G. Maia¹

Author Affiliations

¹Institute of Physics Gleb Wataghin, State University of Campinas, Campinas 13083-872, Brazil

²Department of Applied Mathematics, State University of Campinas, Campinas 13083-250, Brazil

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References(18)

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[5] S. A. Carvalho, S. De Leo. Am. J. Phys., 83, 249(2015).

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[7] A. Rothen. Rev. Sci. Instrum., 16, 26(1945).

[8] R. M. A. Azzam. Selected Papers on Ellipsometry(1991).

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[10] H. G. Tompkins, E. A. Irene. Handbook of Ellipsometry(2005).

[11] K. K. Sharma. Optics: Principles and Applications(2006).

[12] P. Hariharan. Basics of Interferometry(1992).

[13] M. P. Araujo, S. A. Carvalho, S. De Leo. J. Opt., 16, 015702(2014).

[14] M. P. Araújo, S. A. Carvalho, S. De Leo. Phys. Rev. A, 90, 033844(2014).

[15] M. P. Araújo, S. De Leo, G. Maia. Phys. Rev. A, 93, 023801(2016).

[16] O. Santana, S. Carvalho, S. De Leo, L. Araujo. Opt. Lett., 41, 3884(2016).

[17] M. P. Araújo, S. De Leo, G. Maia. Phys. Rev. A, 95, 053836(2017).

[18] M. Araújo, S. De Leo, G. Maia. Ann. Phys., 529, 1600357(2017).

Cited By

[1] S A Carvalho, S De Leo, J A O Huguenin, M Martino, L da Silva. Experimental evidence of laser power oscillations induced by the relative Fresnel (Goos–H?nchen) phase. Laser Physics Letters, 16, 065001(2019).

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Manoel P. Araújo, Stefano De Leo, Gabriel G. Maia, "Optimizing power oscillations in an ellipsometric system," Chin. Opt. Lett. 16, 031406 (2018)

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Paper Information

Category: Lasers and Laser Optics

Received: Oct. 23, 2017

Accepted: Jan. 12, 2018

Published Online: Jul. 13, 2018

The Author Email: Stefano De Leo (deleo@ime.unicamp.br)

DOI:10.3788/COL201816.031406

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology