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Opto-Electronic Engineering, Volume. 34, Issue 9, 5(2007)

Method for measuring the similarity between infrared images of target and its decoy

[in Chinese]1,2, [in Chinese]1, [in Chinese]1, and [in Chinese]1
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  • 2[in Chinese]
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    [1] [1] Harris C,Stepheus M.A combined corner and edge detector[A].Proceeding of the Fourth Alvey Vision Conference[C].Manchester:University of Manchester,1998:147-151.

    [3] [3] Huttenlocher D P,Klanderman G A,Rucldidge W J.Comparing images using the Hausdorff distance[J].IEEE Trans.On Pattern Anal Machine Intell,1993,15(9):850-863.

    [5] [5] Borgefors G.Hierarchical Chamfer matching:A parametric edge matching algorithm[J].IEEE Trans.On Pattern Anal.Machine Intell,1988,10(6):849-865.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Method for measuring the similarity between infrared images of target and its decoy[J]. Opto-Electronic Engineering, 2007, 34(9): 5

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    Paper Information

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    Received: Nov. 10, 2006

    Accepted: --

    Published Online: Feb. 18, 2008

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    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology