Fig. 1. Structural parameters of samples

Fig. 2. (a) XRD patterns of different samples; (b) FWHM and +1 diffraction peak intensity of samples under different annealing temperatures

Fig. 3. PL scanning test results of different samples. (a) Luminous intensity; (b) FWHM

Fig. 4. PL spectrum comparison between untreated sample and RTA treated samples at room temperature

Fig. 5. (a) Normalized peak-differentiating and fitting diagram of untreated sample and RTA treated samples; (b) band splitting graph