Researching | Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera

Optoelectronic Technology, Volume. 44, Issue 2, 102(2024)

Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera

Wei WANG^1,2, Nailong HE^1,3, Yuning ZHANG¹, Ran WEI¹, and Xiaoyu HUANG¹

Author Affiliations

¹School of Electronic Science and Engineering, Southeast University, Nanjing 20096, CHN

²Military Representative Office in Wuxi Region, Army Equipment Department,Wuxi Jiangsu 14000, CHN

³Shi Cheng Laboratory for Information Display and Visualization, Nanjing 210008, CHN

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Fig. 1. Schematic of imaging and testing principle of NED device

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Fig. 2. 2×2 black and white grid test diagram for distortion measurement

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Fig. 3. Diagram of system calibration measurement

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Fig. 4. The hardware construction renderings of the designed NED equipment measurement system

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Fig. 5. Measurement diagram of the system

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Wei WANG, Nailong HE, Yuning ZHANG, Ran WEI, Xiaoyu HUANG. Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera[J]. Optoelectronic Technology, 2024, 44(2): 102

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Paper Information

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Received: Dec. 7, 2023

Accepted: --

Published Online: Jul. 19, 2024

The Author Email:

DOI:10.12450/j.gdzjs.202402004

Topics

laser devices and laser physics

Lasers and Laser Optics

laser manufacturing

Instrumentation, Measurement and Metrology