Optoelectronic Technology, Volume. 44, Issue 2, 102(2024)

Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera

Wei WANG1...2, Nailong HE1,3, Yuning ZHANG1, Ran WEI1 and Xiaoyu HUANG1 |Show fewer author(s)
Author Affiliations
  • 1School of Electronic Science and Engineering, Southeast University, Nanjing 20096, CHN
  • 2Military Representative Office in Wuxi Region, Army Equipment Department,Wuxi Jiangsu 14000, CHN
  • 3Shi Cheng Laboratory for Information Display and Visualization, Nanjing 210008, CHN
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    A near-eye display (NED) test equipment based on binocular CMOS camera was developed, and a technique for measuring the primary optical properties was presented. Fast and low-cost measurement of NED device optical properties was accomplished via derivation modeling, system design, and calibration tests in accordance with important NED optics principles. The final experiment demonstrated that this test system could save around 60% of the measurement time compared to the previous technique, with a key parameter test error of less than 5%.

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    Wei WANG, Nailong HE, Yuning ZHANG, Ran WEI, Xiaoyu HUANG. Near⁃eye Display Critical Optical Performance Test System Based on CMOS Camera[J]. Optoelectronic Technology, 2024, 44(2): 102

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    Paper Information

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    Received: Dec. 7, 2023

    Accepted: --

    Published Online: Jul. 19, 2024

    The Author Email:

    DOI:10.12450/j.gdzjs.202402004

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