Opto-Electronic Engineering, Volume. 35, Issue 10, 116(2008)

Control System for Wafer Transport Device Based on High-precision Prealigner

SONG Yi-xu*, YANG Ze-hong, LI Shi-chang, and ZHAO Yan-nan
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  • [in Chinese]
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    References(4)

    [3] [3] Baker Gregory G,Boylev Edwark F Wafer Centration Device:U.S.Patent,4880384[P].1989-11-14

    [4] [4] Yamamoto Satoshi,Kamei Kenji.Apparatus for Detecting Position of a Notch in a Semiconductor Wafer:U.S.Patent,5438209[P].1995-8-1

    [5] [5] Nakazato Hiroshi,Matsumura Takashi,Akamatsu Takahiro,et al.Device for Positioning a Semi-Conductor Wafer:U.S.Patent 4887904[P].1989-12-19

    [6] [6] Koenig Franklin R.Edge Finding in Wafers:U.S.Patent,4752898[P].1988-6-21

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    SONG Yi-xu, YANG Ze-hong, LI Shi-chang, ZHAO Yan-nan. Control System for Wafer Transport Device Based on High-precision Prealigner[J]. Opto-Electronic Engineering, 2008, 35(10): 116

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    Paper Information

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    Received: Jan. 5, 2008

    Accepted: --

    Published Online: Mar. 1, 2010

    The Author Email: Yi-xu SONG (songyixu@163.com)

    DOI:

    CSTR:32186.14.

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