Laser & Optoelectronics Progress, Volume. 62, Issue 3, 0304001(2025)

Performance of Metal-Semiconductor-Metal Photodetector Based on LSPR Effect

Han Xu1、*, Kexue Sun1,2, and Rongqing Xu1,2
Author Affiliations
  • 1College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing 210023, Jiangsu , China
  • 2National and Local Joint Engineering Laboratory of RF Integration and Micro-Assembly Technology, Nanjing 210023, Jiangsu , China
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    Figures & Tables(7)
    Schematic diagram of 3D simulation structure. (a) Periodic array of hexagonal gold nanowire; (b) schematic diagram of a single cycle interface
    Electric field intensity diagrams at the peak of absorption curve for devices with different GaAs thicknesses. (a) GaAs thickness is 10 nm; (b) GaAs thickness is 30 nm; (c) GaAs thickness is 50 nm
    Absorptivity curves of device under different thicknesses of ITO. (a) GaAs thickness of 10 nm; (b) GaAs thickness of 50 nm
    Variation in absorptivity of device with diameters of gold nanowire
    Variation in device absorptivity under different incidence angles in TE polarization state
    Variation in responsivity and photocurrent with bias voltage
    • Table 1. Electrical and optical input parameters in the simulation[17-18]

      View table

      Table 1. Electrical and optical input parameters in the simulation[17-18]

      ParameterNumerical value
      GaAs permittivity12.9
      GaAs band gap /eV1.42
      GaAs electron affinity /eV4.07
      GaAs carrier lifetime /psElectron: 0.1;hole: 0.4
      GaAs mobility /(cm2·v-1·s-1Electron: 400;hole: 100
      GaAs conductivity/(s·m-11.1×103
      N_type doping /cm-31×1015
      Vacuum wave impedance /Ω377
      Temperature /K300
      Auger electron coefficient /(cm6·s-17×10-30
      Auger hole coefficient /(cm6·s-17×10-30
      Bias voltage /V5
      Incident light power /mW10
      Incident wavelength /nm1280
      Resistivity coefficient /(Ω·m25×10-6
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    Han Xu, Kexue Sun, Rongqing Xu. Performance of Metal-Semiconductor-Metal Photodetector Based on LSPR Effect[J]. Laser & Optoelectronics Progress, 2025, 62(3): 0304001

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    Paper Information

    Category: Detectors

    Received: Apr. 26, 2024

    Accepted: May. 28, 2024

    Published Online: Feb. 10, 2025

    The Author Email:

    DOI:10.3788/LOP241182

    CSTR:32186.14.LOP241182

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