Electromagnetic modeling of interference, confocal, and focus variation microscopy

Tobias Pahl; Felix Rosenthal; Johannes Breidenbach; Corvin Danzglock; Sebastian Hagemeier; Xin Xu; Marco Künne; Peter Lehmann

doi:10.1117/1.APN.3.1.016013

Advanced Photonics Nexus, Volume. 3, Issue 1, 016013(2024)

Electromagnetic modeling of interference, confocal, and focus variation microscopy

Tobias Pahl*... Felix Rosenthal, Johannes Breidenbach, Corvin Danzglock, Sebastian Hagemeier, Xin Xu, Marco Künne and Peter Lehmann |Show fewer author(s)

Author Affiliations

University of Kassel, Faculty of Electrical Engineering and Computer Science, Measurement Technology Group, Kassel, Germany

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Tobias Pahl, Felix Rosenthal, Johannes Breidenbach, Corvin Danzglock, Sebastian Hagemeier, Xin Xu, Marco Künne, Peter Lehmann, "Electromagnetic modeling of interference, confocal, and focus variation microscopy," Adv. Photon. Nexus 3, 016013 (2024)

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