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Acta Optica Sinica, Volume. 44, Issue 16, 1612003(2024)

Influence of Fast Axis Angle of Wave Plate on Accuracy of Spatially Modulated Polarization Measurements

Xinxin Zhang1,2, Tianlei Ning1,2, Lihui Liu1,2、*, and Yanqiu Li1,2、**
Author Affiliations
  • 1School of Optics and Photonics, Beijing Institute of Technology, Beijing 100081, China
  • 2Key Laboratory of Photoelectronic Imaging Technology and System, Ministry of Education, Beijing Institute of Technology, Beijing 100081, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (11)
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    References (21)
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    Figures & Tables(11)
    Schematic of the experimental system

    Fig. 1. Schematic of the experimental system

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    Characteristics of model parameters under different azimuth angles. (a) Maximum value; (b) minimum value; (c) mean value; (d) variance

    Fig. 2. Characteristics of model parameters under different azimuth angles. (a) Maximum value; (b) minimum value; (c) mean value; (d) variance

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    Model parameters when the fast axis azimuth is 0°. (a) m00; (b) m01; (c) m02; (d) m03

    Fig. 3. Model parameters when the fast axis azimuth is 0°. (a) m00; (b) m01; (c) m02; (d) m03

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    Model parameters when the fast axis azimuth is 15°. (a) m00; (b) m01; (c) m02; (d) m03

    Fig. 4. Model parameters when the fast axis azimuth is 15°. (a) m00; (b) m01; (c) m02; (d) m03

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    Model parameters when the fast axis azimuth is 30°. (a) m00; (b) m01; (c) m02; (d) m03

    Fig. 5. Model parameters when the fast axis azimuth is 30°. (a) m00; (b) m01; (c) m02; (d) m03

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    Model parameters when the fast axis azimuth is 45°. (a) m00; (b) m01; (c) m02; (d) m03

    Fig. 6. Model parameters when the fast axis azimuth is 45°. (a) m00; (b) m01; (c) m02; (d) m03

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    Modulated images of horizontally polarized light under different fast axis azimuth angles. (a) 0°; (b) 15°; (c) 30°; (d) 45°

    Fig. 7. Modulated images of horizontally polarized light under different fast axis azimuth angles. (a) 0°; (b) 15°; (c) 30°; (d) 45°

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    • Table 1. Detection accuracy under different fast axis azimuth angles

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      Table 1. Detection accuracy under different fast axis azimuth angles

      Azimuth-45°-30°-15°0°15°30°45°
      S1-AVME0.00070.00210.00100.00070.00110.00470.0006
      S2-AVME0.00070.00360.00080.00100.00090.00520.0007
      S3-AVME0.32360.00620.00050.00040.00080.01340.3313
      Average value0.10830.00400.00080.00070.00090.00780.1109

    • Table 2. Measurement accuracy under different fast axis azimuth angles when the LED output current is 64 mA

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      Table 2. Measurement accuracy under different fast axis azimuth angles when the LED output current is 64 mA

      Azimuth-45°-30°-15°0°15°30°45°
      S1-AVME0.02650.00340.01760.00260.00260.01760.0134
      S2-AVME0.05290.00210.04930.00250.00270.04930.0247
      S3-AVME0.15470.00240.00890.00280.00200.00890.3500
      Average AVME0.07800.00260.02530.00260.00240.02530.1294

    • Table 3. Measurement accuracy under different fast axis azimuth angles when the LED output current is 65 mA

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      Table 3. Measurement accuracy under different fast axis azimuth angles when the LED output current is 65 mA

      Azimuth-45°-30°-15°0°15°30°45°
      S1-AVME0.02650.00370.01840.00190.00240.01300.0145
      S2-AVME0.05290.00170.05380.00270.00200.02320.0259
      S3-AVME0.15470.00210.00740.00230.00240.00410.2761
      Average AVME0.07800.00250.02650.00230.00230.01340.1055

    • Table 4. Measurement accuracy under different fast axis azimuth angles when the LED output current is 66 mA

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      Table 4. Measurement accuracy under different fast axis azimuth angles when the LED output current is 66 mA

      Azimuth-45°-30°-15°0°15°30°45°
      S1-AVME0.02450.00820.00280.00240.00900.14020.0389
      S2-AVME0.01020.01130.00200.00240.01430.24890.2194
      S3-AVME0.16840.00320.00190.00170.00440.07000.2728
      Average AVME0.06770.00760.00220.00210.00920.15300.1770
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    Xinxin Zhang, Tianlei Ning, Lihui Liu, Yanqiu Li. Influence of Fast Axis Angle of Wave Plate on Accuracy of Spatially Modulated Polarization Measurements[J]. Acta Optica Sinica, 2024, 44(16): 1612003

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    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Mar. 20, 2024

    Accepted: Apr. 29, 2024

    Published Online: Aug. 5, 2024

    The Author Email: Liu Lihui (liulihui@bit.edu.cn), Li Yanqiu (liyanqiu@bit.edu.cn)

    DOI:10.3788/AOS240753

    CSTR:32393.14.AOS240753

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology