Optical Instruments, Volume. 43, Issue 6, 64(2021)
An apparatus for inspecting adjacent surfaces defects of TEC component based on equal-optical-path polarization splitting imaging
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Tingdi LIAO, Shaobin YAN, Qilu HUANG, Yantang HUANG, Xudong CUI. An apparatus for inspecting adjacent surfaces defects of TEC component based on equal-optical-path polarization splitting imaging[J]. Optical Instruments, 2021, 43(6): 64
Category: INSTRUMENTS
Received: Jul. 20, 2021
Accepted: --
Published Online: Jun. 29, 2022
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