Photonics Research, Volume. 13, Issue 3, 781(2025)

Broadband spectropolarimetry based on single-shot intensity images of polychromatic structured vector beams

Chao Gao1,2,3, Xiaoyu Cao1,3, Jianyu Weng1,3, Bin Zhang1,3, Dechao Liu1,3, Yuying Mei1,3, Xuheng Yang4, Wei Liu1,3, and Bing Lei1,3、*
Author Affiliations
  • 1College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha 410073, China
  • 2State Key Laboratory of Laser Interaction with Matter, Northwest Institute of Nuclear Technology, Xi’an 710028, China
  • 3Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China
  • 4College of Science, National University of Defense Technology, Changsha 410073, China
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    Figures & Tables(12)
    Comparison between conventional spectropolarimetry, metasurface-based spectropolarimetry, and PVB-based spectropolarimetry. (a)–(c) Schematics of DoS method, DoT method, and channeled method. (d) Schematics of metasurface-based spectropolarimetry. (e) Schematics of PVB spectropolarimetry. SOP, state of polarization; BS, beam splitter; R, retarder; D, detector; I, intensity; λ, wavelength; PM, phase modulator; A, analyzer; DOE, diffractive optical element; V, vortex retarder; PVB, polychromatic vector beam.
    Design and fabrication of DOE. (a) Schematic of one SiNx nanopillar, (b) calculated phase profile and zooming in on central part of it, (c) phase shift of the eight selected SiNx nanopillars at four representative wavelengths, and (d) SEM results of the fabricated DOE.
    Demonstration configuration of PVB-based spectropolarimeter. The broadband light source, the polarizer (P), and the quarter-wave plate (Q) serve as a broadband polarization state generator. The DOE, achromatic plano-convex lens (L), and vortex retarder (V) convert incident polychromatic waves into collimated PVBs. An analyzer (A) maps the spectrum and polarization into a spatially varying intensity pattern, which is recorded by a scientific CMOS camera for further analysis.
    Fitted relation between the wavelengths and the pixel radii.
    Normalized measured modulated vector a→(r,φ). (a)–(d) represent the parameters a0(φ,r) to a3(φ,r), respectively. The inner and outer pixel radii of the rings are 532 and 940, corresponding to the wavelengths of 399.5 nm and 701.1 nm, respectively.
    Captured RGB intensity images and the obtained intensity variations within VIS range. (a) and (c) Spectrally uniform linearly polarized beam generated by a 30° P. (b) and (d) Spectrally varying polarized beam generated by a 40° P and a 5° Q.
    Measured results and measured error for normalized Stokes vector. (a) and (b) Spectrally uniform linearly polarized beam generated by a 30° P. (c) and (d) Spectrally varying polarized beam generated by a 40° P and a 5° Q.
    Theoretical and experimental data of eight measurements.
    Measured and fitted coefficients during the mutarotation of glucose solution. (a) Evolution of coefficient A. (b) Evolution of coefficient B.
    (a) Measured ORD of α-D-glucose, β-D-glucose, and glucose solution at equilibrium. (b) Concentration variations of α and β anomers during the reaction.
    • Table 1. Phase Shift of the Eight Selected SiNx Nanopillars at Four Representative Wavelengths

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      Table 1. Phase Shift of the Eight Selected SiNx Nanopillars at Four Representative Wavelengths

      Phase Shift
      Wavelength100 nm175 nm205 nm235 nm255 nm280 nm315 nm340 nm
      400 nm0.24π1.01π1.20π1.36π1.53π1.91π2.42π2.88π
      500 nm0.25π0.98π1.29π1.54π1.70π1.74π2.21π2.37π
      600 nm0.80π1.21π1.86π2.26π2.47π2.76π2.91π3.10π
      700 nm0.25π0.5π0.75π1.00π1.25π1.50π1.75π2.00π
    • Table 2. Pixel Radius at Each Wavelength

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      Table 2. Pixel Radius at Each Wavelength

      Wavelength (nm)450500550600650
      Pixel radius600.79667.05733.66801.96870.58
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    Chao Gao, Xiaoyu Cao, Jianyu Weng, Bin Zhang, Dechao Liu, Yuying Mei, Xuheng Yang, Wei Liu, Bing Lei, "Broadband spectropolarimetry based on single-shot intensity images of polychromatic structured vector beams," Photonics Res. 13, 781 (2025)

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    Paper Information

    Category: Instrumentation and Measurements

    Received: Nov. 12, 2024

    Accepted: Jan. 14, 2025

    Published Online: Mar. 3, 2025

    The Author Email: Bing Lei (leibing_2000@nudt.edu.cn)

    DOI:10.1364/PRJ.547025

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