Defect Precursors of 5.0 eV Absorption Band in Fused Silica

Acta Optica Sinica, Volume. 20, Issue 3, 423(2000)

[in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese]. Defect Precursors of 5.0 eV Absorption Band in Fused Silica[J]. Acta Optica Sinica, 2000, 20(3): 423

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Category: Materials

Received: Oct. 5, 1998

Accepted: --

Published Online: Aug. 9, 2006

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