Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources

Ruirong Wang; Zhiheng Fang; Honghai An; Jun Xiong; Zhiyong Xie; Erfu Guo; Chen Wang; Anle Lei; Wei Wang

doi:10.3788/COL202018.061101

Chinese Optics Letters, Volume. 18, Issue 6, 061101(2020)

Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources

Ruirong Wang^1,2、*, Zhiheng Fang^1,2, Honghai An^1,2, Jun Xiong^1,2, Zhiyong Xie^1,2, Erfu Guo^1,2, Chen Wang^1,2, Anle Lei^1,2, and Wei Wang^1,2

Author Affiliations

¹Shanghai Institute of Laser Plasma, China Academy of Engineering Physics, Shanghai 201899, China

²National Laboratory on High Power Lasers and Physics, Shanghai 201899, China

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Ruirong Wang, Zhiheng Fang, Honghai An, Jun Xiong, Zhiyong Xie, Erfu Guo, Chen Wang, Anle Lei, Wei Wang, "Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources," Chin. Opt. Lett. 18, 061101 (2020)

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Paper Information

Category: Imaging Systems

Received: Oct. 21, 2019

Accepted: Feb. 28, 2020

Posted: Mar. 2, 2020

Published Online: May. 14, 2020

The Author Email: Ruirong Wang (wangrr59@163.com)

DOI:10.3788/COL202018.061101

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology