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Frontiers of Optoelectronics, Volume. 9, Issue 4, 555(2016)

Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method

Ran YAO1、*, Dawei ZHANG1, Bing ZOU1, and Jian XU2
Author Affiliations
  • 1Engineering Research Center of Optical Instrument and System, Ministry of Education, University of Shanghai for Science and Technology, Shanghai 200093, China
  • 2Department of Engineering Science and Mechanics, Pennsylvania State University, University Park, PA 16802, USA
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    Ran YAO, Dawei ZHANG, Bing ZOU, Jian XU. Junction temperature measurement of alternating current light-emitting-diode by threshold voltage method[J]. Frontiers of Optoelectronics, 2016, 9(4): 555

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    Paper Information

    Category: RESEARCH ARTICLE

    Received: Jun. 12, 2015

    Accepted: Aug. 3, 2015

    Published Online: Mar. 9, 2017

    The Author Email: Ran YAO (yrdr@163.com)

    DOI:10.1007/s12200-015-0533-8

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology