Opto-Electronic Engineering, Volume. 34, Issue 6, 44(2007)
Numerical simulation of infrared nondestructive testing based on transient heating with high energy
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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Numerical simulation of infrared nondestructive testing based on transient heating with high energy[J]. Opto-Electronic Engineering, 2007, 34(6): 44
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