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Laser & Optoelectronics Progress, Volume. 52, Issue 4, 41602(2015)

Range Analysis of Thermal Stress and Displacement of GaN films on Al2O3 Substrate

Wang Xiaozeng*
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    Wang Xiaozeng. Range Analysis of Thermal Stress and Displacement of GaN films on Al2O3 Substrate[J]. Laser & Optoelectronics Progress, 2015, 52(4): 41602

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    Paper Information

    Category: Materials

    Received: Nov. 6, 2014

    Accepted: --

    Published Online: Apr. 2, 2015

    The Author Email: Wang Xiaozeng (21772778@qq.com)

    DOI:10.3788/lop52.041602

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology