Fig. 1. Dynamic logic gates (a) Cold spare gate, (b) Sequence-enforcing gate, (c) Functional-dependence gate

Fig. 2. Sequence failure logic diagram for case:

Fig. 3. Flow chart of Monte Carlo numerical simulation of DFTs based on minimum cut sequence sets

Fig. 4. Sequence failure logic diagram for case: A1→AA10A2→⋯→A̲Ai-10A̲i,a→⋯→AAn-10An

Fig. 5. Sequence failure logic diagram for case: A1→AA10A2→⋯→A̲Ai-10A̲i,w→⋯→AAn-10An

Fig. 6. Modeling method of equipment startup time and startup failure in DFT based on Monte Carlo numerical simulation

Fig. 7. System diagram of simplified power supply for nuclear power plant

Fig. 8. DFT model of EDGs^[13]

Fig. 9. Comparison of EDGs failure probability (a) Failure probability comparison, (b) Effect of equipment startup time on EDGs failure probability

Fig. 10. The sensitivity change curve of equipment parameters

Fig. 11. Frequency histogram of EDGs failure probability

Fig. 12. Effect of startup characteristics on EDGs failure probability (a) Probability under different start time, (b) ln( θ) under different start time