Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera

Shoulong Xu; Kuicheng Lin; Yongchao Han; Shuliang Zou; Xiuwu Yu; Qifan Wu; Yantao Qu; Hongtao Quan; Zengyan Li

doi:10.3788/AOS202040.1523002

Acta Optica Sinica, Volume. 40, Issue 15, 1523002(2020)

Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera

Shoulong Xu^1,2、*, Kuicheng Lin³, Yongchao Han^4、**, Shuliang Zou^1、***, Xiuwu Yu¹, Qifan Wu², Yantao Qu⁴, Hongtao Quan⁵, and Zengyan Li⁶

Author Affiliations

¹School of Resource Environment and Safety Engineering, University of South China, Hengyang, Hunan 421001, China

²Department of Engineering Physics, Tsinghua University, Beijing 100084, China

³Instituted of Materials, China Academy of Engineering Physics, Mianyang, Sichuan 621700, China

⁴CNNC New Energy Company Limited, Beijing 102413, China

⁵School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China

⁶Northwest Institute of Nuclear Technology, Xi′an, Shaanxi 710024, China

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Shoulong Xu, Kuicheng Lin, Yongchao Han, Shuliang Zou, Xiuwu Yu, Qifan Wu, Yantao Qu, Hongtao Quan, Zengyan Li. Study on γ-Ray Irradiation Damage Mode and Characterization of CMOS APS Camera[J]. Acta Optica Sinica, 2020, 40(15): 1523002

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Paper Information

Category: Optical Devices

Received: Mar. 12, 2020

Accepted: May. 6, 2020

Published Online: Aug. 14, 2020

The Author Email: Xu Shoulong (xusl@usc.edu.cn), Han Yongchao (hanyongchao@ciae.ac.cn), Zou Shuliang (zousl2013@126.com)

DOI:10.3788/AOS202040.1523002

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