Fig. 1. Schematic of the gain media and heat sink.

Fig. 2. Schematic of the experimental setup.

Fig. 3. Output power and thin disk (TD) temperature versus absorbed pump power of (a) 1 at.% doped and (b) 0.5 at.% doped systems.

Fig. 4. Beam profiles of 1 at.% doped system at different absorbed pump powers: (a) 8.3 W, (b) 18.5 W, (c) 23.7 W, (d) 28.6 W and (e) 34.4 W.

Fig. 5. Beam profiles of 0.5 at.% doped system at different absorbed pump powers: (a) 9.1 W, (b) 18.5 W, (c) 24.4 W, (d) 28.8 W, (e) 34.7 W and (f) 38.8 W.

Fig. 6. Output beam quality. Near-field beam profile (upper left) and far-field beam profile (upper right).

Fig. 7. Two-dimensional temperature distributions of the undoped end face of the crystal at the maximum output power in simulations of (a) 1 at.% doped and (b) 0.5 at.% doped systems.

Fig. 8. Temperature distributions along with the undoped end face of (a) 1 at.% doped and (b) 0.5 at.% doped systems; the central axes of (c) 1 at.% doped and (d) 0.5 at.% doped systems.

Fig. 9. Thermal induced OPDs of (a) 1 at.% doped and (b) 0.5 at.% doped systems; equivalent radii of curvature fitting of (c) 1 at.% doped and (d) 0.5 at.% doped systems.