Fig. 1. Schematic diagram of metasurfacecolor filter structure

Fig. 2. Reflection spectrum corresponding to the duty cycle change, optimized reflection spectrum and its color gamut diagram. (a) Plane reflection spectrum at φ=0°; (b) plane reflection spectrum at φ=90°; (c) optimized reflection spectrum of the two planes; (d) CIE1931 color gamut diagram corresponding to the reflection spectrum

Fig. 3. Reflection spectrum corresponding to the change of grating height, optimized reflection spectrum and its color gamut diagram. (a) Reflection spectrum at φ=0°; (b) reflection spectrum at φ=90°; (c) optimized reflection spectrum of the two planes; (d) CIE1931 color gamut diagram corresponding to the reflection spectrum

Fig. 4. Reflection spectrum corresponding to changes in dielectric layer thickness, optimized reflection spectrum and its color gamut diagram. (a) Reflection spectrum at φ=0°; (b) reflection spectrum at φ=90°; (c) optimized reflection spectrum of the two planes; (d) CIE1931 color gamut diagram corresponding to the reflection spectrum

Fig. 5. Reflection spectrum and color corresponding to the incident angle change. (a) Reflection spectrum at φ=0°; (b) reflection spectrum at φ=90°; (c) CIE1931 color gamut at φ=0°; (d) CIE1931 color gamut at φ=90°

Fig. 6. Electric field intensity distribution maps. (a) TE wave incident at φ=0°; (b) TM wave incident at φ=0°; (c) TE wave incident at φ=90°; (d) TM wave incident at φ=90°

Fig. 7. SEM topography and profile. (a) SEM topography; (b) profile

Fig. 8. Sample reflection color under white light and reflection spectrum. (a) Aample color at φ=0°; (b) sample color at φ=90°; (c) reflection spectrum test curve of the sample in two planes; (d) CIE1931 color gamut diagram corresponding to the sample test curve

Fig. 9. Reflection spectrum of the two planes

Fig. 10. Reflection spectrum corresponding to the change of dielectric refractive index. (a) Reflection spectrum at φ=0°; (b) reflection spectrum at φ=90°