Superiority of zoom lens coupling in designing a novel X-ray image detector

Chinese Optics Letters, Volume. 6, Issue 7, 502(2008)

Chunyu Yu^1、*, Benkang Chang², and Dianxiu Wei²

Author Affiliations

¹Key Laboratory of Integrated Microsystems, Shenzhen Graduate School of Peking University, Shenzhen 518055

²School of Optoelectronic and Electronic Engineering, Nanjing University of Science and Technology, Nanjing 210094

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References(8)

[1] [1] C. Yu, T. Liu, L. Wu, and B. Chang, Proc. SPIE 5630, 141 (2005).

[3] [3] Z. Zuo, Sensitization Materials (in Chinese) (3) 21 (2000).

[4] [4] W. Jin, G. Liu, X. Wang, Z. Wang, H. Sun, and L. Ding, Opt. Technique (in Chinese) 30, 460 (2004).

[5] [5] C. Yu, B. Chang, and D. Wei, Rev. Sci. Instrum. 77, 123102 (2006).

[6] [6] C. Yu, B. Chang, and D. Wei, J. Sci. Instrum. (in Chinese) 28, 150 (2007).

[7] [7] S. Zheng, Nondestructive Testing (in Chinese) 28, 222 (2006).

[8] [8] C. Yu, B. Chang, and D. Wei, Opto-Electron. Eng. (in Chinese) 33, 120 (2006).

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Chunyu Yu, Benkang Chang, Dianxiu Wei, "Superiority of zoom lens coupling in designing a novel X-ray image detector," Chin. Opt. Lett. 6, 502 (2008)

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Paper Information

Received: Jan. 22, 2008

Accepted: --

Published Online: Jul. 11, 2008

The Author Email: Chunyu Yu (yukate@163.com)

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