Fig. 1. Schematic of beam splitting modulation phase retrieval

Fig. 2. (a) Amplitude and (b) phase of target sample; (c) amplitude and (d) phase of output beam of target sample

Fig. 3. (a) Amplitude and (b) phase of weakly scattering plate; (c) incident beam pass through target sample and grating form the illuminating beam on weakly scattering specimen; (d)final diffraction patterns on CCD chip

Fig. 4. Reconstructed (a) amplitude and (b) phase of target sample;(c) curve of iteration error changed with iteration times

Fig. 5. Reconstructed (a) amplitude and (b) phase of output beam when the grating has 3×3 diffraction orders;reconstructed (c) amplitude and (d) phase of output beam when the grating has 4×4 diffraction orders; reconstructed (e) amplitude and (f) phase of output beam when the grating has 5×5 diffraction orders; (g) curve of iteration error changed with iteration times when the diffraction grating has 3×3, 4×4, 5×5 diffraction orders respectively

Fig. 6. (a) Final recorded diffraction patterns when the weakly scattering plate has position error; reconstructed (b) amplitude and (c) phase of output beam of target sample; (d) phase distribution automatically identified and corrected by software

Fig. 7. (a1)-(e1) amplitude and (a2)-(e2) phase of target sample reconstructed from the recorded diffraction patterns with different noises; (f) curves of error changed with iteration times

Fig. 8. (a)(b) Two non-overlapping plane objects at a distance of 2 mm represent a three-dimensional object; (c)(d) amplitude of the reconstructed complex field of incident beam on the Dammann grating propagate back to the plane of (a) object and (b) object by Fresnel diffraction

Fig. 9. (a) Reconstructed amplitude of object A; (b) reconstructed amplitude of object AB;(c) reconstructed amplitude of object ABC; (d) reconstructed amplitude of object ABCD; (e) reconstructed amplitude of object cell; (f) curves of iterative error changed with the iteration times when reconstructing (a)~(e)