Analysis of Terahertz Time Domain Spectroscopy of Mixtures Based on Indirect Hard Modeling Method

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

doi:10.3964/j.issn.1000-0593(2017)10-3021-06

Spectroscopy and Spectral Analysis, Volume. 37, Issue 10, 3021(2017)

Analysis of Terahertz Time Domain Spectroscopy of Mixtures Based on Indirect Hard Modeling Method

[in Chinese]^*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of Terahertz Time Domain Spectroscopy of Mixtures Based on Indirect Hard Modeling Method[J]. Spectroscopy and Spectral Analysis, 2017, 37(10): 3021

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Paper Information

Received: Sep. 14, 2016

Accepted: --

Published Online: Dec. 25, 2017

The Author Email: (1192372240@qq.com)

DOI:10.3964/j.issn.1000-0593(2017)10-3021-06

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology