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Chinese Optics Letters, Volume. 1, Issue 6, 06311(2003)

High efficiency broad bandwidth erbium-doped superfluorescent fiber source

Wencai Huang*, Hai Ming, Jianping Xie, Xiyao Chen, Anting Wang, and Liang Lu
Author Affiliations
  • Department of Physics, University of Science and Technology of China, Hefei 230026
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    CLP Journals

    [1] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. [J]. Optics and Precision Engineering, 2005, 13(2): 205

    [2] Yanyong Wang, Huanmin Bao, Xiaojun Jiang, Tianxin Yang, Shichen Li, Zhan Sui, Mingzhong Li, Lei Ding, Yiming Luo, Runchang Zhao, "An 88-nm broadband ASE source with bismuth-based erbium-doped fiber," Chin. Opt. Lett. 3, 0104 (2005)

    [3] [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Mixing Performance of HYLTE Nozzle in CW DF/HF Chemical Lasers[J]. Chinese Journal of Lasers, 2005, 32(5): 627

    [4] Jiaming Li, Chuangkai Li, Yun Chen, Nan Zhao, Zhiyun Hou, Qingmao Zhang, Guiyao Zhou, "Broadband fluorescence emission in Bi-doped silica glass prepared by laser additive manufacturing technology," Chin. Opt. Lett. 18, 121601 (2020)

    [5] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A High-power Erbium-doped Fiber Super-fluorescent Source[J]. Acta Photonica Sinica, 2004, 33(11): 1298

    [6] [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. A Novel C+L Band Erbium-Doped Fiber Broadband Light Source with High Power[J]. Chinese Journal of Lasers, 2005, 32(5): 609

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    Wencai Huang, Hai Ming, Jianping Xie, Xiyao Chen, Anting Wang, Liang Lu, "High efficiency broad bandwidth erbium-doped superfluorescent fiber source," Chin. Opt. Lett. 1, 06311 (2003)

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    Paper Information

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    Received: Dec. 20, 2002

    Accepted: --

    Published Online: Jun. 6, 2006

    The Author Email: Wencai Huang (huangwc@eyou.com)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology