Acta Optica Sinica, Volume. 41, Issue 24, 2412002(2021)
Fast Self-Calibration Method of Gamma Factor Based on Fourier Transform
Fig. 2. Phase error analysis results. (a) Standard sinusoidal input and non-sinusoidal output; (b) ideal phase main value and actual output phase main value; (c) phase error caused by Gamma nonlinearity
Fig. 3. Simulated fringe patterns captured by a CCD camera. (a) Standard sinusoidal fringe γ0=1; (b) distorted fringe γ0=0.6; (c) distorted fringe γ0=1.5; (d) distorted fringe γ0=2.1
Fig. 4. Comparison of the sine characteristics of fringes with different Gamma values
Fig. 5. Spectrograms of the 300th line under different Gamma distortions. (a) γ0=1; (b) γ0=0.6; (c) γ0=1.5; (d) γ0=2.1
Fig. 6. The lowest power ratio search curves in the frequency domain under different Gamma distortions. (a) γ0=0.6; (b) γ0=1.5; (c) γ0=2.1
Fig. 8. Comparison before and after single-line fringe correction. (a) Gray scale comparison; (b) phase error comparison
Fig. 9. Grating fringe projection measurement system. (a) Structure diagram of the measurement system; (b) actual measurement equipment
Fig. 10. Comparison before and after the distortion grating fringe correction. (a) Captured grating fringes before correction; (b) captured grating fringes after correction
Fig. 11. Single-line spectrograms before and after the distortion grating fringe correction. (a) Spectrogram of the 500th line of grating fringes before correction; (b) spectrogram of the 500th line of grating fringes after correction
Fig. 13. Absolute phase maps before and after phase error correction. (a) Before correction; (b) after correction
Fig. 14. Absolute phase restoration of plaster vase. (a) Measuring object; (b) uncorrected absolute phase; (c) absolute phase after monotonic smoothing correction; (d) absolute phase after double four-step correction; (e) absolute phase after correction by the proposed method
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Lijun Sun, Zhiyuan Huang, Tianfei Chen. Fast Self-Calibration Method of Gamma Factor Based on Fourier Transform[J]. Acta Optica Sinica, 2021, 41(24): 2412002
Category: Instrumentation, Measurement and Metrology
Received: Apr. 8, 2021
Accepted: Jun. 24, 2021
Published Online: Nov. 30, 2021
The Author Email: Chen Tianfei (chen_tianfei@163.com)