A New Method to Measure the Optical-Axis Azimuth of Quarter-Wave Plate in Light Path Accurately

[in Chinese]; [in Chinese]

Acta Optica Sinica, Volume. 28, Issue 3, 487(2008)

[in Chinese]^* and [in Chinese]

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[in Chinese]

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References(3)

[1] [1] Badr-Eddine Benkelfat, El-Houssine Horache, Qin Zou et al.. An electro-optic modulation technique for direct and accurate measurement of birefringence[J]. Opt. Commun., 2003, (221): 271～278

[8] [8] Soe-Mie F. Nee. Depolarization and principal Mueller matrix measured by null ellipsometry[J]. Appl. Opt., 2001, 40(28): 4933～4939

[9] [9] Mircea Mujat, Aristide Dogariu. Real-time measurement of the polarization transfer function[J]. Appl. Opt., 2001, 40(1): 34～44

CLP Journals

[1] Kaihua Yuan, Jianxun Deng, Chao Liu, Zuohua Huang. A Fast and Simultaneous Method for Measuring Wave Plate Phase Retardation and Fast Axis Azimuth[J]. Laser & Optoelectronics Progress, 2018, 55(2): 021202

[2] Wang Jun, Chen Lei, Yin Jiayi, Shi Lili. A New Method for Calibration of the Soleil-Babinet Compensator[J]. Chinese Journal of Lasers, 2009, 36(11): 3015

[3] Song Zhitang, Li Guohua, Peng Handong, Kong Fanmei, Kong Qingdian. Temperature Effect of Composite Compensator[J]. Acta Optica Sinica, 2009, 29(6): 1626

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[in Chinese], [in Chinese]. A New Method to Measure the Optical-Axis Azimuth of Quarter-Wave Plate in Light Path Accurately[J]. Acta Optica Sinica, 2008, 28(3): 487

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Jun. 21, 2007

Accepted: --

Published Online: Mar. 24, 2008

The Author Email: (zts-123@163.com)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology