Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy

Lei Liu; Zhenglan Bian; Zuoren Dong; Fenghong Chu; Yuanhang Wang; Jinglin Li; Lu Zhang

doi:10.3788/LOP202259.0417001

Laser & Optoelectronics Progress, Volume. 59, Issue 4, 0417001(2022)

Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy

Lei Liu^1,2, Zhenglan Bian^1、*, Zuoren Dong^2、**, Fenghong Chu¹, Yuanhang Wang³, Jinglin Li¹, and Lu Zhang¹

Author Affiliations

¹College of Electronics and Information Engineering, Shanghai University of Electric Power, Shanghai 201306, China

²Key Laboratory of Space Laser Communication and Detection Technology, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

³Information Optics and Optoelectronic Technology Laboratory, Shanghai Institute of Optics and Compact Mechanics, Chinese Academy of Sciences, Shanghai 201800, China

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Lei Liu, Zhenglan Bian, Zuoren Dong, Fenghong Chu, Yuanhang Wang, Jinglin Li, Lu Zhang. Detection of Residual Organic Pesticides in Yam by Surface Enhanced Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2022, 59(4): 0417001

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Paper Information

Category: Medical Optics and Biotechnology

Received: Jan. 28, 2021

Accepted: Mar. 18, 2021

Published Online: Jan. 25, 2022

The Author Email: Zhenglan Bian (bianzhenglan@163.com), Zuoren Dong (zrdong@siom.ac.cn)

DOI:10.3788/LOP202259.0417001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology