Chinese Journal of Lasers, Volume. 31, Issue 2, 153(2004)

Study of Cavity Mirrors of DF Chemical Laser with High Damage Threshold

[in Chinese]1,2、*, [in Chinese]2, and [in Chinese]1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    References(4)

    [1] [1] Francois R. Flory, Marcel Dekker. Thin Films for Optical Systems [M]. New York: Marcel Dekker, Inc., 1995. 140~141

    [2] [2] Antonio R. Marrujo, Christopher Lieto, Pat Pomphrey et al.. Deuterium-Fluoride uncooled optics at HELSTF [C]. Critical Reviews, 1997, CR67:373~392

    [5] [5] J. A. Harrington, J. E. Rudisill, M. Braunstein. Thin-film 2.8 μm and 3.8 μm absorption in single-layer film [J]. Appl. Opt., 1978, 17(17):2798~2800

    [6] [6] M. Debenham. Refractive indices of zinc sulfide in the 0.405~13 μm wavelength range [J]. Appl. Opt., 1984, 23(14):2238~2239

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    [in Chinese], [in Chinese], [in Chinese]. Study of Cavity Mirrors of DF Chemical Laser with High Damage Threshold[J]. Chinese Journal of Lasers, 2004, 31(2): 153

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    Paper Information

    Category: laser devices and laser physics

    Received: Feb. 13, 2003

    Accepted: --

    Published Online: Jun. 12, 2006

    The Author Email: (huangweiff@sohu.com)

    DOI:

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