Method for Measuring High Temperature Spectral Line Parameters Based on Calibration-Free Wavelength Modulation Technology

Zang Yipeng; Xu Zhenyu; Xia Huihui; Huang An; He Yabai; Kan Ruifeng

doi:10.3788/CJL202047.1011001

Chinese Journal of Lasers, Volume. 47, Issue 10, 1011001(2020)

Method for Measuring High Temperature Spectral Line Parameters Based on Calibration-Free Wavelength Modulation Technology

Zang Yipeng^1,2, Xu Zhenyu¹, Xia Huihui¹, Huang An^1,2, He Yabai¹, and Kan Ruifeng^3、*

Author Affiliations

¹Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China

²University of Science and Technology of China, Hefei, Anhui 230026, China

³State Key Laboratory of Applied Optics, Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun, Jilin 130033, China

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Zang Yipeng, Xu Zhenyu, Xia Huihui, Huang An, He Yabai, Kan Ruifeng. Method for Measuring High Temperature Spectral Line Parameters Based on Calibration-Free Wavelength Modulation Technology[J]. Chinese Journal of Lasers, 2020, 47(10): 1011001

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Paper Information

Category: spectroscopy

Received: Apr. 24, 2020

Accepted: --

Published Online: Oct. 16, 2020

The Author Email: Ruifeng Kan (rfkan@ciomp.ac.cn)

DOI:10.3788/CJL202047.1011001

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology