Experiment Science and Technology, Volume. 23, Issue 4, 156(2025)

Training and Maintenance of the Scanning Electron Microscope-Based Electron Beam Lithography System in University Teaching and Research

Yujie HAN* and Wenchang ZHU
Author Affiliations
  • Institute of Functional Nano & Soft Materials, Soochow University, Suzhou 215123, China
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    References(5)

    [1] MATSUMOTO H, NOMURA H, KIMURA H et al. Current performance and future plans on electron multi-beam mask writers toward high-NA EUV era[C], 1249708(2023).

    [2] GEORGE R B[M]. Electron-beam technology in microelectronic fabrication(1980).

    [7] SHEN Y Q, ZHENG W W, ZHU K C et al. Variability and yield in h-BN-based memristive circuits: The role of each type of defect[J]. Advanced Materials, 33, 2103656(2021).

    [8] ZHU K C, PAZOS S, AGUIRRE F et al. Hybrid 2D–CMOS microchips for memristive applications[J]. Nature, 618, 57-62(2023).

    [9] MA P, LIU K Z, HUANG G G et al. Epsilon-near-zero substrate-enabled strong coupling between molecular vibrations and mid-infrared plasmons[J]. Optics Letters, 47, 4524-4527(2022).

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    Yujie HAN, Wenchang ZHU. Training and Maintenance of the Scanning Electron Microscope-Based Electron Beam Lithography System in University Teaching and Research[J]. Experiment Science and Technology, 2025, 23(4): 156

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    Paper Information

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    Received: Apr. 11, 2024

    Accepted: --

    Published Online: Jul. 30, 2025

    The Author Email: Yujie HAN (yjhan@suda.edu.cn)

    DOI:10.12179/1672-4550.20240191

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