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Chinese Journal of Lasers, Volume. 40, Issue 8, 815001(2013)

Quantitative Analysis of Fenitrothion Based on Surface-Enhanced Raman Spectroscopy

Weng Shizhuang1,2、*, Zheng Shouguo2, Li Pan1,2, Chen Sheng1,2, Zeng Xinhua2, Li Miao2, and Zheng Xiaoju1,2
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    Weng Shizhuang, Zheng Shouguo, Li Pan, Chen Sheng, Zeng Xinhua, Li Miao, Zheng Xiaoju. Quantitative Analysis of Fenitrothion Based on Surface-Enhanced Raman Spectroscopy[J]. Chinese Journal of Lasers, 2013, 40(8): 815001

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    Paper Information

    Category: Spectroscopy

    Received: Feb. 23, 2013

    Accepted: --

    Published Online: Jul. 26, 2013

    The Author Email: Shizhuang Weng (weng1989@mail.ustc.edu.cn)

    DOI:10.3788/cjl201340.0815001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology