[1] [1] LEMEN J R, DUNCAN D, EDWARDS C S, et al.. Solar X-Ray Imager for GOES ［J］. SPIE,2004,5171:65-76.

[2] [2] XIAO T Q, XIA S J. A new long trace profiler for aspheric optical surface metrology ［J］. SPIE, 2002,4927:208-213.

[3] [3] QIAN SH N, TAKACS P Z. Equal optical path beamsplitter for a pencil beam interferometer and shearing interferometer ［J］. Opt. Eng., 2003,42(4):929-934.

[4] [4] MORIYASU S, TAKACS P Z, KATO J, et al.. On-machine metrology with LTP (Long Trace Profiler) ［J］. SPIE,2003,5180:385-392.

[5] [5] COCCO D,BIANCO A, SOSTERO G. A second optic head for the ELETTRA long trace profiler ［J］. SPIE, 2005,5921: 59210L-1-59210L-10.

[6] [6] QIAN J, ASSOUFID L,MACRANDER A. Comparison of slope and height profiles for flat synchrotron X-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer ［J］. SPIE, 2007, 6704: 67040C-1-67040C-7.

[7] [7] XUE CH X, HUO F R, ZHOU CH ZH, et al.. Research on the measuring method of the slope error of EUV/X-ray optical elements and measuring apparatus of long trace profiler ［J］. SPIE, 2007,6723:67231W-1 -67231W-6.

[8] [8] LIU B, WANG Q P, FU S J. Investigation of long trace profiler for aspherical optics ［J］. Laser & Optoelectronics Progress，2006，43(2):46-53. (in Chinese)

[9] [9] LI ZH, ZHAO Y, LI D CH, et al.. A Diffractive long trace profiler for large aspherical optics ［J］. Acta Optica Sinica, 2002, 22(10): 4221-8221. (in Chinese)

[10] [10] QIAN SH N, TAKACS P Z. The penta-prism LTP: A long-trace-profiler with stationary optical head and moving penta prism ［J］. Rev. Sci. Instrum. , 1995,66(3):2562-2569.

[11] [11] QIAN SH N,TAKACS P,SOSTERO G, et al.. Portable long trace profiler: Concept and solution ［J］. Review of Scientific Instruments, 2001,72(8):3198-3204.

[12] [12] GUBAREV M, KESTER T, PETER Z.Takacs. Calibration of a vertical-scan long trace profiler at MSFC ［J］. SPIE, 2001,4451:333-340.

[13] [13] HIGASHI Y,TAKAIE Y, ENDO K, et al.. A new designed ultra-high precision profiler-study on slope error measurement of a mandrel for wolter type-I mirror fabrication- ［C］. Proc. 8th Int. Conf. X-ray Microscopy IPAP Conf. 2004,Series 7:192-194.

[14] [14] MA D M, HAN CH Y. System design of large flat mirror measurement based on pentagon prism scanning technique ［J］. Electronic Measurement Technology, 2007,30(11):90-95. (in Chinese)

[15] [15] KUANG C F, FENG Q B, LIU B, et al.. Influences on the deflection angle of the pentagonal prism due to dithering and fabrication angle error ［J］. Optical Technique, 2004,30(5):616-622. (in Chinese)

[16] [16] MA D M, LIU ZH X, MA L, et al.. Influences of alignment error in pentaprism scanning system and fabrication angle error on measuring accuracy of optical surface ［J］. Opt. Precision Eng., 2008,16(12):2517-2523. (in Chinese)

[17] [17] MALLIK P C V, ZHAO CH Y, BURGE J H. Measurement of a 2-meter flat using a pentaprism scanning system ［J］. Opt. Eng. 2007,42(6):023602-1-023602-9.

[18] [18] YELLOWHAIR J, BURGE J H. Analysis of a scanning pentaprism system for measurements of large flat mirrors ［J］. Appleed Optics, 2007,46(35):8466-8474.