Fig. 1. Relationship between optic axis of a crystal and polarization direction of incident light

Fig. 2. View of the wave vector kand normal line of the crystal in spherical coordinate

Fig. 3. Separation of o-light and e-light when a beam is incident on a crystal and expression of e-light refractive index in a refractive index ellipsoid

Fig. 4. Normalized near-field intensity distribution of E1x, E1y, E1z after the crystal when L=1080mm and θC=0

Fig. 5. Phase difference distribution Δϕ between e rays and o rays when L=1080mm and θC=0

Fig. 6. Normalized near-field intensity distribution of E1x and E1y after the crystal when L=360 mm, θC=5°, and αC=45°

Fig. 7. Phase difference distribution Δϕ between e rays and o rays when L=360 mm, θC=5°, and αC=45°

Fig. 8. Far-field focal spot of beams without PS and with PS

Fig. 9. With different d, focal spot separation amount changing with the tilt angle θC. (a) Δz; (b) Δr

Fig. 10. CPP surface distribution used for simulation

Fig. 11. Far-field focal spot intensity distribution with CPP and with CPP+PS

Fig. 12. FOPAI curves of focal spot with CPP and with CPP+PS, the horizontal axis represents the relative strength, Imean is the average intensity of the focal spot

Fig. 13. Partial enlarged view of the far-field pattern of beams with CPP and with CPP+PS

Fig. 14. km changing with θC under different crystal thicknesses

Fig. 15. kr changing with θC under different crystal thicknesses

Fig. 16. ke changing with θC under different crystal thicknesses