Study on Diopter Measurement Technology of Progressive Multi-Focus Lens Using Phase-Shifting Talbot Interferometer

Haifei Xu; Yong He

doi:10.3788/LOP202259.1312001

Laser & Optoelectronics Progress, Volume. 59, Issue 13, 1312001(2022)

Study on Diopter Measurement Technology of Progressive Multi-Focus Lens Using Phase-Shifting Talbot Interferometer

Haifei Xu¹ and Yong He^1,2、*

¹School of Electronic Engineering and Optoelectronic Technology, Nanjing University of Science and Technology, Nanjing 210094, Jiangsu , China

²Key Laboratory of Advanced Solid Laser Industry and Information Technology Ministry, Nanjing 210094, Jiangsu , China

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Figures & Tables(8)

Fig. 1. Schematic diagram of lens diopter measurement by Talbot interferometer

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Fig. 2. Schematic diagram of the included angle between reference grating and CCD coordinate

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Fig. 3. Physical diagram of the experimental device

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Fig. 4. Moiré fringe values of different diopters collected by the system

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Fig. 5. Moiré fringe of progressive multi-focus lens

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Fig. 6. Diopter distribution of progressive multi-focal lens.(a) Overall distribution; (b) evolutionary channel diopter ditribution

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Table 1. Average values of ten measurements with different diopters of single focus lens

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Table 1. Average values of ten measurements with different diopters of single focus lens

Parameter	Nominal value
Parameter	-7.50	-5.00	-3.00	-1.00	-7.50	-5.00	-3.00	-1.00
Average value	-7.540	-4.985	-2.990	-1.035	-7.540	-4.985	-2.990	-1.035
Root mean square	0.066	0.085	0.078	0.049	0.066	0.085	0.078	0.049
Maximum error	0.10	0.12	0.12	0.10	0.10	0.12	0.12	0.10

Table 2. Diopter measurement data in near area of multi-focus lens
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Table 2. Diopter measurement data in near area of multi-focus lens
Parameter Number
1 2 3 4 5
Average value -1.284 -1.262 -1.283 -1.290 -1.286
Root mean square 0.031 0.039 0.044 0.039 0.051
Maximum error 0.05 0.07 0.08 0.06 0.08

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Haifei Xu, Yong He. Study on Diopter Measurement Technology of Progressive Multi-Focus Lens Using Phase-Shifting Talbot Interferometer[J]. Laser & Optoelectronics Progress, 2022, 59(13): 1312001

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