Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method

Weibin Chen; Qiwen Zhan

Chinese Optics Letters, Volume. 5, Issue 12, 709(2007)

Weibin Chen^* and Qiwen Zhan

Author Affiliations

Electro-Optics Graduate Program, University of Dayton, 300 College Park, Dayton, Ohio 45469-0245, USA

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References(8)

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[2] [2] A. Lewis, M. Isaacson, A. Harootunian, and A. Muray, Ultramicrosc. 13, 227 (1984).

[3] [3] A. Bouhelier, J. Renger, M. R. Beversluis, and L. Novotny, J. Microscopy 210, 220 (2003).

[4] [4] H. Frey, C. Bolwien, A. Brandenburg, R. Ros, and D. Anselmetti, Nanotechnology 17, 3105 (2006).

[5] [5] L. Vaccaro, L. Aeschimann, U. Staufer, H. P. Herzig, and R. Dandliker, Appl. Phys. Lett. 83, 584 (2003).

[6] [6] W. Chen and Q. Zhan, Proc. SPIE 6450, 64500D (2007).

[7] [7] W. Chen and Q. Zhan, Opt. Express 15, 4106 (2007).

[8] [8] Q. Zhan and J. R. Leger, Opt. Express 10, 324 (2002).

CLP Journals

[1] Xiaogang Hong, Wendong Xu, Xiaogang Li, Chengqiang Zhao, Xiaodong Tang, "Field enhancement effect of metal probe in evanescent field," Chin. Opt. Lett. 7, 0174 (2009)

[2] Zhehai Zhou, Qiaofeng Tan, Guofan Jin, "Focusing of high polarization order axially-symmetric polarized beams," Chin. Opt. Lett. 7, 938 (2009)

[3] Li Huang, Zhoufeng Wang, Zhuomin Li, Wenli Deng, "Electroless nickel plating on optical fiber probe," Chin. Opt. Lett. 7, 06472 (2009)

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Weibin Chen, Qiwen Zhan, "Field enhancement analysis of an apertureless near field scanning optical microscope probe with finite element method," Chin. Opt. Lett. 5, 709 (2007)

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Paper Information

Received: Jul. 10, 2007

Accepted: --

Published Online: Dec. 12, 2007

The Author Email: Weibin Chen (qiwen.zhan@notes.udayton.edu)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology