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Chinese Optics Letters, Volume. 15, Issue 3, 030004(2017)

Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)

Guadalupe López-Morales1、*, Victor-Manuel Rico-Botero1, Rafael Espinosa-Luna1, and Qiwen Zhan2
Author Affiliations
  • 1GIPYS Laboratory, Centro de Investigaciones en Óptica, A. C., León, Gto 37150, México
  • 2Department of Electro-Optics and Photonics, University of Dayton, Dayton, OH 45469, USA
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    Guadalupe López-Morales, Victor-Manuel Rico-Botero, Rafael Espinosa-Luna, Qiwen Zhan, "Refractive index measurement of dielectric samples using highly focused radially polarized light (Invited Paper)," Chin. Opt. Lett. 15, 030004 (2017)

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    Paper Information

    Special Issue: COMPLEX OPTICAL FIELDS

    Received: Oct. 27, 2016

    Accepted: Dec. 28, 2016

    Published Online: Jul. 25, 2018

    The Author Email: Guadalupe López-Morales (lopezmg@cio.mx)

    DOI:10.3788/COL201715.030004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology