Study on Annealing Technology of Mid-/Long-Wavelength Two-Color Type-II Superlattice Infrared Focal Plane Device

Jing-feng LI; Ming LIU; Jin-yu ZHANG; Wei FU

doi:11.3969/j.issn.1672-8785.2025.06.002

INFRARED, Volume. 46, Issue 6, 10(2025)

Study on Annealing Technology of Mid-/Long-Wavelength Two-Color Type-II Superlattice Infrared Focal Plane Device

Jing-feng LI^*, Ming LIU, Jin-yu ZHANG, and Wei FU

Author Affiliations

North China Research Institute of Electro-Optics, Beijing 100015, China

show less

Abstract Get PDF(in Chinese)

References(2)

[5] [5] Reibel Y, Chabuel F, Vaz C, et al. Infrared Dual Band detectors for next generation[C].SPIE, 2011,8012: 801238.

[6] [6] Delaunay P Y, Nosho B Z, Gurga A R, et al. Advances in III-V Based Dual-Band MWIR/LWIR FPAs at HRL[C].SPIE, 2017,10177: 101770T.

Tools

Get Citation

Copy Citation Text

LI Jing-feng, LIU Ming, ZHANG Jin-yu, FU Wei. Study on Annealing Technology of Mid-/Long-Wavelength Two-Color Type-II Superlattice Infrared Focal Plane Device[J]. INFRARED, 2025, 46(6): 10

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: Nov. 28, 2024

Accepted: Jul. 3, 2025

Published Online: Jul. 3, 2025

The Author Email: LI Jing-feng (ljf_0902@163.com)

DOI:11.3969/j.issn.1672-8785.2025.06.002

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology