[1] [1] Hiroshi Takasako. Automatic ellipsometer. automatic polarimetry by means of an ADP polarization modulator Ⅲ[J]. Appl. Opt.,1966,5(5):759-764

[2] [2] J. L. Ord,B. L. Wills. A computer-operated following ellipsometry[J]. Appl. Opt.,1967,6(10):1673-1677

[3] [3] H. J. Mathieu,D. E. McClure,R. H. Muller. Fast self-compensating ellipsometer[J]. Rev. Sci. Instrum.,1974,45(6):798-802

[4] [4] M. Yamamoto,Y. Hotta,M. Sato. A tracking ellipsometer of picometer sensitivity enabling 0.1% sputtering-rate monitoring of EUV nanometer multilayer fabrication[J]. Thin. Solid. Film,2003,433:224-229

[5] [5] H. Zhu,L. Liu,Y. Wen et al.. High-precision system for automatic null ellipsometric measurement[J]. Appl. Opt.,2002,41(22):4536-4540

[6] [6] K. Postava,A. Maziewski,T. Yamaguchi et al.. Null ellipsometer with phase modulation[J]. Opt. Express,2004,12(24):6040-6045

[7] [7] Harland G. Tompkins,Eugene A. Irene. Handbook of Ellipsometry[M]. New York:William Andrew,Inc.,2005. 12

[8] [8] Kun Yang,Aijun Zeng,Xiangzhao Wang et al.. Real-time measurement of the fast axis angle of a quarter-wave plate based on simultaneous shifting technique[J]. Chin. Opt. Lett.,2008,6(8):568-571

[9] [9] Kun Yang,Aijun Zeng,Xiangzhao Wang et al.. Method for rapid measuring retardation of a quarter-wave plate based on simultaneous shifting technique [J]. Chin. Opt. Lett.,2008,6(9):673-675

[10] [10] Yang Kun,Zeng Aijun,Wang Xiangzhao et al.. Fast axis calibration of quarter-wave plate by foundamental component extinction[J]. Chinese J. Lasers,2007,34(11):1553-1556